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Resonant control of an atomic force microscope micro-cantilever for active Q control

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posted on 2025-05-09, 09:25 authored by M. Fairbairn, S. O. R. Moheimani
Active Qcontrol may be used to modify the effective quality (Q) factor of an atomic force microscope(AFM) micro-cantilever when operating in tapping mode. The control system uses velocity feedback to obtain an effective cantilever Q factor to achieve optimal scan speed and image resolution for the imaging environment and sample type. Time delay of the cantilever displacement signal is the most common method of cantilever velocity estimation. Spill-over effects from unmodeled dynamics may degrade the closed loop system performance, possibly resulting in system instability, when time delay velocity estimation is used. A resonant controller is proposed in this work as an alternate method of velocity estimation. This new controller has guaranteed closed loop stability, is easy to tune, and may be fitted into existing commercial AFMs with minimal modification. Images of a calibration grating are obtained using this controller to demonstrate its effectiveness.

History

Journal title

Review of Scientific Instruments

Volume

83

Issue

8

Publisher

American Institute of Physics

Language

  • en, English

College/Research Centre

Faculty of Engineering and Built Environment

School

School of Electrical Engineering and Computer Science

Rights statement

© American Institute of Physics

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