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Diagonal control design for atomic force microscope piezoelectric tube nanopositioners

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journal contribution
posted on 2025-05-11, 09:04 authored by B. Bhikkaji, Yuen Kuan YongYuen Kuan Yong, I. A. Mahmood, S. O. R. Moheimani
Atomic Force Microscopes (AFM) are used for generating surface topography of samples at micro to atomic resolutions. Many commercial AFMs use piezoelectric tube nanopositioners for scanning. Scanning rates of these microscopes are hampered by the presence of low frequency resonant modes. When inadvertently excited, these modes lead to high amplitude mechanical vibrations causing the loss of accuracy, while scanning, and eventually to break down of the tube. Feedback control has been used to damp these resonant modes. Thereby, enabling higher scanning rates. Here, a multivariable controller is designed to damp the first resonant mode along both the x and y axis. Exploiting the inherent symmetry in the piezoelectric tube, the multivariable control design problem is recast as independent single-input single-output (SISO) designs. This in conjunction with integral resonant control is used for damping the first resonant mode.

Funding

ARC

History

Journal title

Review of Scientific Instruments

Volume

84

Issue

2

Publisher

American Institute of Physics

Language

  • en, English

College/Research Centre

Faculty of Engineering and Built Environment

School

School of Electrical Engineering and Computer Science

Rights statement

© American Institute of Physics

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