This article compares the performance of traditional and recently proposed demodulators for multifrequency atomic force microscopy. The compared methods include the lock-in amplifier, coherent demodulator, Kalman filter, Lyapunov filter, and direct-design demodulator. Each method is implemented on a field-programmable gate array (FPGA) with a sampling rate of 1.5 MHz. The metrics for comparison include the sensitivity to other frequency components and the magnitude of demodulation artifacts for a range of demodulator bandwidths. Performance differences are demonstrated through higher harmonic atomic force microscopy imaging.
History
Journal title
Beilstein Journal of Nanotechnology
Volume
11
Pagination
76-91
Publisher
Beilstein - Institut zur Foerderung der Chemischen Wissenschaften
Language
en, English
College/Research Centre
College of Engineering, Science and Environment
School
School of Electrical Engineering and Computer Science
Rights statement
This is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/4.0). Please note that the reuse, redistribution and reproduction in particular requires that the authors and source are credited.