Open Research Newcastle
Browse

Robust MPC design for fault tolerance of constrained multisensor linear systems

Download (300.72 kB)
conference contribution
posted on 2025-05-09, 07:23 authored by Alain Yetendje, Maria SeronMaria Seron, José A. De Doná
In this paper, a robust fault-tolerant control strategy for constrained multisensor linear systems, subject to sensor faults and in the presence of bounded state and output disturbances is proposed. The scheme verifies that for each sensors estimator combination, suitable residual variables lie inside precomputed sets and selects the more appropriate combination based on a chosen criterion. An active fault tolerant output feedback controller yields an MPC-based control law and by means of the notion of “tube” of trajectories, we ensure robust closed-loop exponential stability and good performance in the fault-free case and under the occurrence of abrupt sensor faults.

History

Source title

2010 Conference on Control and Fault Tolerant Systems (SysTol)

Name of conference

Conference on Control and Fault Tolerant Systems (SysTol 2010)

Location

Nice, France

Start date

2010-10-06

End date

2010-10-08

Pagination

752-758

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Place published

Piscataway, NJ

Language

  • en, English

College/Research Centre

Faculty of Engineering and Built Environment

School

School of Electrical Engineering and Computer Science

Rights statement

Copyright © 2010 IEEE. Reprinted from the 2010 Conference on Control and Fault Tolerant Systems, p. 752-758. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Newcastle products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

Usage metrics

    Publications

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC