posted on 2025-05-09, 23:20authored byMikhail V. Konnik, James Stuart Welsh
A Shack-Hartmann (SH) wavefront sensor (WFS) is used in most modern adaptive optics systems where precision and robustness of centroiding are important issues. The accuracy of the SH WFS depends not only on lenslet quality but also on the measurement accuracy of centroids, especially in low-light conditions. In turn, accuracy depends on light and dark noises that are inevitably present in solid-state photosensors. Using a comprehensive mathematical model of the CMOS photosensor, the accuracy of the Shack-Hartmann wavefront sensor is assessed and analysed for each type of noise. In this paper, new results regarding the influence of different noise sources from a CMOS photosensor on centroiding in Shack-Hartmann wavefront sensors are presented. For the numerical simulations, a comprehensive mathematical model of photosensor's noise was formulated. The influences of light and dark noises as well as pixelisation factor have been assessed. Analysis of the wavefront sensor's accuracy is provided. Results should be of interest for further development of cost-effective wavefront sensors.
History
Source title
Astronomical Adaptive Optics Systems and Applications IV: Proceedings of of SPIE, Volume 8149
Name of conference
Astronomical Adaptive Optics Systems and Applications IV: SPIE Optical Engineering + Applications
Location
San Diego, CA
Start date
2011-08-20
End date
2011-08-24
Pagination
81490G-1-81490G-11
Publisher
SPIE
Place published
San Diego, CA
Language
en, English
College/Research Centre
Faculty of Engineering and Built Environment
School
School of Electrical Engineering and Computer Science
Rights statement
Copyright 2011 SPIE. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.