This paper presents a 12-electrode piezoelectric tube scanner for fast atomic force microscopy (AFM). The scanner is used simultaneously as a sensor and an actuator. The built-in sensing mechanism of the scanner allows for displacement measurement and the unique arrangement of the electrodes allows the tube to be driven in an anti-symmetrical manner, resulting in a collocated system suitable for positive-position feedback (PPF). A PPF controller is designed to damp the scanner's resonance. The device is installed into an AFM to obtain open- and closed-loop images of a grating at 10Hz, 15.6Hz and 31Hz scan rates. The closed-loop images are noticeably superior to the open-loop images, showcasing the effectiveness of the proposed scanner.
History
Source title
Proceedings of the 2010 American Control Conference
Name of conference
2010 American Control Conference (ACC 2010)
Location
Baltimore, MD
Start date
2010-06-30
End date
2010-07-02
Pagination
4957-4962
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Place published
Baltimore, MD
Language
en, English
College/Research Centre
Faculty of Engineering and Built Environment
School
School of Electrical Engineering and Computer Science