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A 12-electrode piezoelectric tube scanner for fast atomic force microscopy

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conference contribution
posted on 2025-05-09, 07:24 authored by Yuen Kuan YongYuen Kuan Yong, Bilal Ahmed, S. O. R. Moheimani
This paper presents a 12-electrode piezoelectric tube scanner for fast atomic force microscopy (AFM). The scanner is used simultaneously as a sensor and an actuator. The built-in sensing mechanism of the scanner allows for displacement measurement and the unique arrangement of the electrodes allows the tube to be driven in an anti-symmetrical manner, resulting in a collocated system suitable for positive-position feedback (PPF). A PPF controller is designed to damp the scanner's resonance. The device is installed into an AFM to obtain open- and closed-loop images of a grating at 10Hz, 15.6Hz and 31Hz scan rates. The closed-loop images are noticeably superior to the open-loop images, showcasing the effectiveness of the proposed scanner.

History

Source title

‬Proceedings of the 2010 American Control Conference

Name of conference

2010 American Control Conference (ACC 2010)

Location

Baltimore, MD

Start date

2010-06-30

End date

2010-07-02

Pagination

4957-4962

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Place published

Baltimore, MD

Language

  • en, English

College/Research Centre

Faculty of Engineering and Built Environment

School

School of Electrical Engineering and Computer Science

Rights statement

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